DocumentCode :
2090619
Title :
Quality analysis of wheat based on BP neural network and Near Infrared Reflectance Spectroscopy
Author :
Hexiao, Liu ; Mingliang, Liu ; Laijun, Sun ; Haibo, Qian ; Wenbo, Li ; Lekai, Wang ; Changjun, Dai
Author_Institution :
Key Lab. of Electron. Eng., Heilongjiang Univ., Harbin, China
fYear :
2011
fDate :
27-29 May 2011
Firstpage :
775
Lastpage :
778
Abstract :
With its quick, simple, nicety and nondestructive characteristic, NIRS (Near Infrared Reflectance Spectroscopy) is a new method for quality analysis of wheat. In this paper, a new method to model-building for wheat quality analysis with NIRS is presented. Opposite near infrared parameters shield the testing accuracy from outer disturb and random factors. Local minimization is escaped, and a high convergence velocity is reached by modified BP algorithm. The experimental results indicate that a high-accuracy testing results can be get in spite of large disturb from temperature and moisture.
Keywords :
backpropagation; crops; infrared spectra; minimisation; neural nets; quality management; reflectivity; NIRS; convergence velocity; high-accuracy testing; local minimization; modified BP neural network algorithm; near infrared reflectance spectroscopy; opposite near infrared parameters; outer disturbance factor; random factors; wheat quality analysis; Artificial neural networks; Mathematical model; Neurons; Predictive models; Proteins; Spectroscopy; Training; near infrared reflectance spectroscopy; neural network; quality analysis; wheat;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
New Technology of Agricultural Engineering (ICAE), 2011 International Conference on
Conference_Location :
Zibo
Print_ISBN :
978-1-4244-9574-0
Type :
conf
DOI :
10.1109/ICAE.2011.5943907
Filename :
5943907
Link To Document :
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