Title :
Nonlocal two dimensional denoising of frequency specific chirp evoked ABR single trials
Author :
Schubert, J.K. ; Teuber, T. ; Steidl, G. ; Strauss, D.J. ; Corona-Strauss, Farah I.
Author_Institution :
Neurocenter, Saarland Univ., Homburg, Germany
fDate :
Aug. 28 2012-Sept. 1 2012
Abstract :
Recently, we have shown that denoising evoked potential (EP) images is possible using two dimensional diffusion filtering methods. This restoration allows for an integration of regularities over multiple stimulations into the denoising process. In the present work we propose the nonlocal means (NLM) method for EP image denoising. The EP images were constructed using auditory brainstem responses (ABR) collected in young healthy subjects using frequency specific and broadband chirp stimulations. It is concluded that the NLM method is more efficient than conventional approaches in EP imaging denoising, specially in the case of ABRs, where the relevant information can be easily masked by the ongoing EEG activity, i.e., signals suffer from rather low signal-to-noise ratio SNR. The proposed approach is for the a posteriori denoising of single trials after the experiment and not for real time applications.
Keywords :
biodiffusion; bioelectric potentials; electroencephalography; image denoising; medical image processing; neurophysiology; EEG activity; EP image denoising; NLM method; a posteriori denoising; auditory brainstem responses; evoked ABR single trials; evoked potential image denoising; frequency specific broad-band chirp stimulations; frequency specific chirp; nonlocal means method; nonlocal two dimensional denoising; signal-noise ratio; two dimensional diffusion filtering methods; Auditory system; Chirp; Image color analysis; Morphology; Noise reduction; Signal to noise ratio; Algorithms; Electroencephalography; Evoked Potentials, Auditory, Brain Stem; Humans; Signal Processing, Computer-Assisted; Signal-To-Noise Ratio;
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2012 Annual International Conference of the IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-4119-8
Electronic_ISBN :
1557-170X
DOI :
10.1109/EMBC.2012.6346478