Title :
Can IDDQ test replace conventional stuck-fault test?
Author_Institution :
IBM, Boca Raton, FL, USA
Abstract :
Defect analysis of CMOS circuits is performed to show the test effectiveness of IDDQ testing. Results show that the test patterns generated by the stuck-fault model can detect nearly 100% of stuck-at faults and a very high percentage of delay faults and stuck-open faults. The IDDQ testing technique can detect gate oxide shorts, bridging faults, and some delay faults. However, IDDQ tests do not guarantee the improvement of stuck-at fault test coverage and they cannot detect the majority of delay defects and open defects
Keywords :
CMOS integrated circuits; fault location; integrated circuit testing; CMOS circuits; IDDQ test; bridging faults; delay defects; delay faults; gate oxide shorts; stuck-at faults; stuck-fault model; stuck-fault test; stuck-open faults; test effectiveness; test patterns; Circuit analysis; Circuit faults; Circuit testing; Delay; Electrical fault detection; Fault detection; Performance analysis; Performance evaluation; Semiconductor device modeling; Test pattern generators;
Conference_Titel :
Custom Integrated Circuits Conference, 1991., Proceedings of the IEEE 1991
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-0015-7
DOI :
10.1109/CICC.1991.164121
