Title :
Simultaneous measurement of the electrical and magnetic properties of a superconductive plate sample with a bifilar coil
Author :
Yamazaki, Sadao ; Nakane, Hiroshi ; Tanaka, Akio
Author_Institution :
Kogakuin Univ., Tokyo, Japan
Abstract :
In order to simultaneously evaluate the resistivity (ρ) and the magnetic penetration depth (λ) of a flat plate superconductor, a method using a bifilar winding coil is proposed. The bifilar winding coil, which has the same properties, consists of two coils located at same place. When a current is applied in the same or opposite direction with the sample fixed, the magnetic fluxes augment or counteract each other. The difference in the synthetic impedance of the two coils in the above cases corresponds to the cases when there is a sample or no sample in the conventional method (SRPM method). This difference is compared with the values calculated for ρ and λ as parameters to estimate the experimental values of ρ and λ. For a Bi pellet superconductor, ρ and λ were simultaneously estimated at 10 kHz. The values of ρ and λ at 77.3 K was 4.2×-11 Ωm and 20.4 μm, respectively. This method, which does not electrically touch the sample, is superior to the conventional method for measuring very low resistivity
Keywords :
bismuth compounds; electrical conductivity measurement; electrical resistivity; magnetic variables measurement; penetration depth (superconductivity); superconducting coils; superconducting materials; 10 kHz; 20.4 mum; 77.3 K; Bi pellet superconductor; bifilar coil; bifilar winding coil; electrical properties; flat plate superconductor; magnetic fluxes; magnetic penetration depth; magnetic properties; simultaneous measurement; superconductive plate sample; synthetic impedance; Conductivity; Electric variables measurement; Electromagnetic measurements; Impedance measurement; Magnetic flux; Magnetic properties; Shape measurement; Superconducting coils; Superconducting magnets; Superconductivity;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2000. IMTC 2000. Proceedings of the 17th IEEE
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-5890-2
DOI :
10.1109/IMTC.2000.848668