Title :
Metastability of CMOS master/slave flip-flops
Author :
Gabara, T.J. ; Cyr, G.J. ; Stroud, C.E.
Author_Institution :
AT&T Bell Lab., Allentown, PA, USA
Abstract :
The authors present circuit techniques used to improve the mean time between failures (MTBF) of a latch due to metastable events. The complete approach includes a unique design of the latch and the formation of series-connected master/slave (M/S) flip-flops using this latch. An equation is developed to predict the MTBF due to metastability of a single latch and is extended to include single and multiple series connected M/S flip-flops. The equation predicts that the MTBF increases significantly by using such a M/S flip-flop configuration
Keywords :
CMOS integrated circuits; circuit reliability; flip-flops; integrated logic circuits; CMOS master/slave flip-flops; circuit techniques; flip-flop configuration; latch; mean time between failures; metastable events; multiple series connected; Apertures; Application specific integrated circuits; Clocks; Equations; Flip-flops; Frequency; Latches; Logic; Master-slave; Metastasis;
Conference_Titel :
Custom Integrated Circuits Conference, 1991., Proceedings of the IEEE 1991
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-0015-7
DOI :
10.1109/CICC.1991.164129
