Title :
A hysteresis model for vanadium oxide thermal radiation sensor
Author :
De Almeida, Luiz Alberto L ; Deep, Gurdip S. ; Lima, Antôinio Marcus N ; Neff, Helmut ; Freire, Raimundo S.
Author_Institution :
Dept. de Engenharia Eletrica, Univ. Fed. da Bahia, Salvador, Brazil
Abstract :
This paper presents the adaptation of Preisach model, originally developed for magnetic hysteresis, to describe the hysteresis in the resistance-temperature characteristics of vanadium oxide (VO2) thin film radiation sensor. The necessary and sufficient conditions for the applicability of the Preisach model to VO 2 film sensor are experimentally verified. Experimentally measured characteristics are compared with those given by the model for minor and major loops
Keywords :
electric sensing devices; heat radiation; magnetic hysteresis; radiometry; thin film devices; vanadium compounds; Preisach model; VO2; VO2 film sensor; hysteresis model; magnetic hysteresis; major loops; minor loops; radiation sensor; resistance-temperature characteristics; thermal radiation sensor; vanadium oxide; Bolometers; Magnetic films; Magnetic hysteresis; Mathematical model; Metal-insulator structures; Semiconductor films; Sensor phenomena and characterization; Temperature sensors; Thermal sensors; Thin film sensors;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2000. IMTC 2000. Proceedings of the 17th IEEE
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-5890-2
DOI :
10.1109/IMTC.2000.848671
