DocumentCode
2091118
Title
A single indium ion optical frequency standard
Author
Eckle, P. ; Eichenseer, M. ; Nevsky, A.Yu. ; Schwedes, C. ; Von Zanthier, J. ; Walther, H.
Author_Institution
MPI fur Quantenopt. & Sekt. Phys., Ludwig-Maximilians-Univ. Munchen, Garching
fYear
2004
fDate
5-7 April 2004
Firstpage
258
Lastpage
258
Abstract
A single indium ion stored in a radio-frequency trap and laser-cooled to a temperature below 1 mK is a promising candidate for an optical frequency standard of exceptionally high accuracy and stability. Detection and laser cooling of In+ are performed using the 5s2 1S0 - 5s5p3P1 intercombination line at 231 nm. The dye laser formerly used was recently replaced by a diode-based laser system allowing for long-term operation of the standard. Loading of the trap is now realized by resonant 2-photon ionization of indium at 410 nm. This strongly reduces deposition of indium on the trap electrodes so that contact potentials close to the trapped ion can be avoided.The frequency was determined to 1 267 402 452 899.92 (0.23) kHz (Deltav / v = 1.8 x 10-13), where the measurement uncertainty is dominated by the frequency uncertainty of the He-Ne laser. Further improvements in this measurement together with a comparison with other narrow atomic resonances would allow investigations of variations of fundamental constants in time.
Keywords
frequency standards; indium; laser cooling; photoionisation; semiconductor lasers; trapped ions; two-photon processes; 5s2 1S0 - 5s5p3P1 intercombination; He-Ne; In; atomic resonances; contact potentials; diode laser; frequency uncertainty; laser cooling; measurement uncertainty; optical frequency standard; radio-frequency trap; resonant 2-photon ionization; single indium ion; trap electrodes; trap loading; trapped ion; wavelength 231 nm; wavelength 410 nm;
fLanguage
English
Publisher
iet
Conference_Titel
Frequency and Time Forum, 2004. EFTF 2004. 18th European
Conference_Location
Guildford
ISSN
0537-9989
Print_ISBN
0-86341-384-6
Type
conf
Filename
5074954
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