Title :
A Novel 1.8 V, 1066 Mbps, DDR2, DFI-Compatible, Memory Interface
Author :
Alexandropoulos, A. ; Davrazos, E. ; Plessas, F. ; Birbas, M.
Author_Institution :
Analogies S.A., Patras, Greece
Abstract :
An innovative design of a 533 MHz DDR2 SDRAM PHY based on a common standard bus interface (DFI) and implemented in 90 nm standard CMOS process, is presented in this paper. Off-chip driver with calibrated strength, slew rate control, and on-die termination mechanism are utilized to provide improved signal integrity. Furthermore a DDR3-like I/O architecture and an appropriate calibration mechanism has been employed in order to reduce input capacitance. A Register-Controlled Delay Locked Loop (RCDLL) is included that measures the period of the external DFI clock to generate two stable clock phases (0°, 90°) and aligns it with the internal PHY clock. A novel Dynamic Strobe Masking System (DSMS) has also been employed which, in contrast to traditional techniques, dynamically adjusts the length of the masking signal in real-time, based on the incoming strobe. Finally, the PHY provides the necessary hooks for data capture training by an external calibration engine. Post layout simulation results demonstrate its robustness over process, voltage, and temperature variations.
Keywords :
CMOS memory circuits; DRAM chips; calibration; capacitance; clocks; delay lock loops; CMOS process; DDR2 SDRAM PHY; DFI clock; I/O architecture; bit rate 1066 Mbit/s; calibrated strength; calibration mechanism; dynamic strobe masking system; frequency 533 MHz; input capacitance; memory interface; off-chip driver; on-die termination mechanism; register-controlled delay locked loop; signal integrity; size 90 nm; slew rate control; standard bus interface; voltage 1.8 V; Calibration; Clocks; Delay; Driver circuits; Leg; Resistance; Resistors; DDR2; DLL; SDRAM; memory interface; off-chip driver; on-die termination;
Conference_Titel :
VLSI (ISVLSI), 2010 IEEE Computer Society Annual Symposium on
Conference_Location :
Lixouri, Kefalonia
Print_ISBN :
978-1-4244-7321-2
DOI :
10.1109/ISVLSI.2010.49