DocumentCode :
2091144
Title :
Parameter extraction for large signal noise models and simulation of noise in large signal circuits like mixers and oscillators
Author :
Rohde, Ulrich L. ; Chang, Chao-Ren ; Gerber, Jason ; Pengelly, Raymond
Author_Institution :
Compact Software, Inc., 483 McLean Boulevard, Paterson, NJ, U.S.A. 07054; research professor, New Jersey Institute of Technology, Dept of Electrical Engineering.
fYear :
1993
fDate :
6-10 Sept. 1993
Firstpage :
465
Lastpage :
470
Abstract :
This paper shows how to obtain an equivalent circuit model for bipolar transistors and FEITs to generate a bias-dependent model. The bias-dependent model is required as a seed to obtain starting values for a large signal model. Particularly in the case of calculating noise under large signal conditions, the bias-dependent noise parameters for both bipolar transistors and FETs have to be obtained. For verification purposes, these methods have been implemented in the nonlinear circuit simulator, Microwave Harmonica. We have employed double balanced diode mixers, both active and passive (switching) FET mixers as well as a variety of oscillators to show that the nonlinear noise analysis capabilities are verified in these applications.
Keywords :
Bipolar transistors; Circuit noise; Circuit simulation; Diodes; Equivalent circuits; FETs; Microwave theory and techniques; Nonlinear circuits; Oscillators; Parameter extraction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 1993. 23rd European
Conference_Location :
Madrid, Spain
Type :
conf
DOI :
10.1109/EUMA.1993.336597
Filename :
4136658
Link To Document :
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