DocumentCode :
2091176
Title :
Detection of motion artifacts in photoplethysmographic signals based on time and period domain analysis
Author :
Couceiro, R. ; Carvalho, Paulo ; Paiva, R.P. ; Henriques, J. ; Muehlsteff, J.
Author_Institution :
Dept. of Inf. Eng., Univ. of Coimbra, Coimbra, Portugal
fYear :
2012
fDate :
Aug. 28 2012-Sept. 1 2012
Firstpage :
2603
Lastpage :
2606
Abstract :
The presence of motion artifacts in the photoplethysmographic (PPG) signals is one of the major obstacles in the extraction of reliable cardiovascular parameters in real time and continuous monitoring applications. In the current paper we present an algorithm for motion artifact detection, which is based on the analysis of the variations in the time and period domain characteristics of the PPG signal. The extracted features are ranked using a feature selection algorithm (NMIFS) and the best features are used in a Support Vector Machine classification model to distinguish between clean and corrupted sections of the PPG signal. The results achieved by the current algorithm (SE: 0.827 and SP: 0.927) show that both time and especially period domain features play an important role in the discrimination of motion artifacts from clean PPG pulses.
Keywords :
feature extraction; medical signal detection; medical signal processing; photoplethysmography; support vector machines; PPG pulse; PPG signal; current algorithm; feature extraction; feature selection algorithm; motion artifact detection; period domain analysis; period domain characteristics; photoplethysmographic signal; support vector machine classification model; time domain analysis; Algorithm design and analysis; Classification algorithms; Feature extraction; Monitoring; Noise; Signal processing algorithms; Support vector machines; Adult; Algorithms; Humans; Models, Theoretical; Photoplethysmography; Support Vector Machines; Young Adult;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2012 Annual International Conference of the IEEE
Conference_Location :
San Diego, CA
ISSN :
1557-170X
Print_ISBN :
978-1-4244-4119-8
Electronic_ISBN :
1557-170X
Type :
conf
DOI :
10.1109/EMBC.2012.6346497
Filename :
6346497
Link To Document :
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