Title :
Reconstruction of temperature-change distribution in the cylindrical head model by means of electrical capacitance tomography
Author :
Kimoto, Akira ; Nakatani, Takayuki ; Matsuoka, Yu-Ichiro ; Shida, Katsunori
Author_Institution :
Dept. of Electr. & Electron. Eng., Saga Univ., Japan
Abstract :
The final goal of this study is to accomplish the imaging system of the temperature-change distribution in the human head using the temperature dependence of permittivity. In our method capacitance, which depends on permittivity, is measured by many small electrodes arranged on the surface of the human head. Permittivity distribution is reconstructed and then, temperature-change distribution is imaged. To achieve it, the reconstruction of temperature change distribution in the brain model was presented using the proposed capacitance measurement method. In this paper, the method is extended to solve the lack of data, and the reconstruction of temperature-change distribution in the cylindrical head model is demonstrated. It is difficult to detect the temperature-change around the center of the head model because of insufficient measurement accuracy at this stage. However, it is suggested that the detection of the pattern in temperature-change around the skull region was possible
Keywords :
bioelectric phenomena; biomedical electrodes; biomedical imaging; biothermics; brain models; capacitance measurement; permittivity; tomography; brain model; capacitance measurement method; cylindrical head model; electrical capacitance tomography; permittivity distribution; permittivity temperature dependence; skull region; small electrodes; temperature-change distribution reconstruction; temperature-change pattern; tissue equivalent circuit; Brain modeling; Capacitance measurement; Electrodes; Head; Humans; Image reconstruction; Permittivity measurement; Surface reconstruction; Temperature dependence; Temperature distribution;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2000. IMTC 2000. Proceedings of the 17th IEEE
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-5890-2
DOI :
10.1109/IMTC.2000.848696