Analysis of microstrip discontinuities in multilayered, anisotropic and lossy substrates considering the finite metallization thickness effect

The quasistatic equivalent circuits of several microstrip discontinuities are calculated in the case in which the conducting strips are embedded in a multilayered substrate which may contain both anisotropic dielectrics and materials with a non-negligible conductivity. The effect of finite metallization thickness is incorporated in the analysis by modelling thick strips as pairs of equipotential thin strips. The lumped capacitances and conductances appearing in the equivalent circuits of the discontinuities analyzed are calculated by applying the excess charge technique in the spectral domain.