Rigorous analysis of 2D and 3D planar circuits by using the finite element method approach

A numerical method has been developed for the analysis of microwave devices made with superconducting materials or/and normal (perfect or imperfect) metal conductors and lossy dielectrics. This method, based on 2D and 3D Finite Element Method (F.E.M.) is applied here to evaluate the propagation characteristics of microstrip lines, coplanar waveguides, and the scattering parameters of planar circuits (resonators,. . .). The results given by F.E.M. are compared with those obtained by using other theoretical analysis or/and with experimental data.