• DocumentCode
    2091748
  • Title

    Rigorous analysis of 2D and 3D planar circuits by using the finite element method approach

  • Author

    Thetiot, D. ; Madrangeas, V. ; Aubourg, M. ; Guillon, P.

  • Author_Institution
    IRCOM - Faculté des Sciences - 123 Avenue Albert Thomas, 87060 Limoges Cédex-France
  • fYear
    1993
  • fDate
    6-10 Sept. 1993
  • Firstpage
    540
  • Lastpage
    541
  • Abstract
    A numerical method has been developed for the analysis of microwave devices made with superconducting materials or/and normal (perfect or imperfect) metal conductors and lossy dielectrics. This method, based on 2D and 3D Finite Element Method (F.E.M.) is applied here to evaluate the propagation characteristics of microstrip lines, coplanar waveguides, and the scattering parameters of planar circuits (resonators,. . .). The results given by F.E.M. are compared with those obtained by using other theoretical analysis or/and with experimental data.
  • Keywords
    Circuits; Conducting materials; Dielectric devices; Dielectric losses; Finite element methods; Microstrip resonators; Microwave propagation; Microwave theory and techniques; Superconducting materials; Superconducting microwave devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 1993. 23rd European
  • Conference_Location
    Madrid, Spain
  • Type

    conf

  • DOI
    10.1109/EUMA.1993.336619
  • Filename
    4136680
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2091748