Title :
A novel automated measurement and control system based on VXIbus for I&D logic analysis
Author :
Hongxuan, Zhang ; Yisheng, Zhu ; Wang Wi
Author_Institution :
Biomed. Eng. Dept., Shanghai Jiaotong Univ., China
Abstract :
This paper describes an instrument system which can be easily applied in instrument and data (I&D) simulation and faults detection, especially tracing some minute errors within hardware or software. This novel automated measurement and testing system mainly includes: the control and DSP module, data emulation and generation module and logic analysis module. The set of simulation and testing system is based on latest VXIbus standard and designed as message based and register based C-size modules covering several sophisticated techniques of direct digital synthesis in the secondary interface. After the frame description of test and measurement architectures, this paper details the hardware techniques and software strategies as well as simulation results
Keywords :
automatic test equipment; automatic test software; direct digital synthesis; logic analysers; peripheral interfaces; virtual instrumentation; I&D logic analysis; VXIbus based system; automated measurement and control system; control and DSP module; data emulation and generation module; digital data generation; digital logic analyser; direct digital synthesis; domain and trigger tracing; equivalent space measure; faults detection; hardware techniques; instrument and data simulation; logic analysis module; message based C-size modules; minute errors; register based C-size modules; secondary interface; software strategies; virtual instrument; Automatic control; Automatic generation control; Automatic testing; Control systems; Digital signal processing; Fault detection; Hardware; Instruments; Logic testing; System testing;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2000. IMTC 2000. Proceedings of the 17th IEEE
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-5890-2
DOI :
10.1109/IMTC.2000.848698
