Title :
Semiconductor-based carrier-envelope phase defector
Author :
Jirauschek, Christian ; Duan, Lingjie ; Mücke, Oliver D. ; Kaertner, Fram X. ; Hof, Klaus D. ; Tritschier, T. ; Wegener, Martin
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Massachusetts Inst. of Technol., Cambridge, MA
Abstract :
We study the carrier-envelope phase sensitivity of the inversion in a two-band semiconductor and the influence of rapid dephasing of higher-lying states. The application of this effect for constructing a solid-state phase detector is investigated
Keywords :
III-V semiconductors; conduction bands; high-speed optical techniques; photodetectors; semiconductor device models; valence bands; carrier-envelope phase detector; higher-lying states dephasing; two-band semiconductor;
Conference_Titel :
Quantum Electronics Conference, 2004. (IQEC). International
Conference_Location :
San Francisco, CA
Print_ISBN :
1-55752-778-4
