Title :
A method of evaluating the temperature dependences of dielectric resonators and materials
Author :
Kobayashi, Yoshio ; Kogami, Yoshinori ; Katoh, Masayuki
Author_Institution :
Department of Electrical and Electronics Engineering, Saitama University, Shimo-Okubo 255, Urawa Saitama 338, Japan
Abstract :
The intrinsic temperature coefficient of the resonant frequency TCf0, which is defined as the temperature coefficient of a resonant frequency when all the stored energy is confined inside a dielectric rod, is introduced to evaluate the temperature dependences of dielectric materials. The temperature coefficient of the resonant frequency TCf for a dielectric rod resonator can be estimated accurately from the TCf0 value. Actually, for shielded dielectric resonators of three types; parallel plate, image, and MIC types, it is shown that the TCf values can be estimated with the error of ±0.7 ppm/°C from the measured TCf0 value having the experimental error of ±0.5 ppm/°C
Keywords :
Dielectric materials; Dielectric measurements; Frequency estimation; Mechanical variables measurement; Microwave integrated circuits; Permittivity measurement; Resonant frequency; Stress measurement; Temperature dependence; Temperature measurement;
Conference_Titel :
Microwave Conference, 1993. 23rd European
Conference_Location :
Madrid, Spain
DOI :
10.1109/EUMA.1993.336627