DocumentCode :
2092250
Title :
Electronic tongue and electronic nose data fusion in classification with neural networks and fuzzy logic based models
Author :
Sundic, T. ; Marco, S. ; Samitier, J. ; Wide, P.
Author_Institution :
Dept. d´´Electron., Barcelona Univ., Spain
Volume :
3
fYear :
2000
fDate :
2000
Firstpage :
1474
Abstract :
One of the most interesting application areas of electronic noses is the food industry. In some cases when the results are not satisfactory, fusing the data of an electronic nose and an electronic tongue can result in highly increased performance. In this paper we combine the information of both instruments, and test their performance in potato chips and potato creams classification problem. Results for five classification techniques are compared, all based either on fuzzy logic systems or artificial neural networks. The results obtained using just nose or tongue information are compared to those when both instruments were fused. We show that the overall performance of a classifier was substantially increased for all algorithms
Keywords :
array signal processing; backpropagation; chemistry computing; curve fitting; electrochemical sensors; feature extraction; fuzzy logic; fuzzy set theory; gas sensors; multilayer perceptrons; pattern classification; principal component analysis; radial basis function networks; sensor fusion; voltammetry (chemical analysis); PCA; RBF network; backpropagation; classifier performance; curve fitting; data fusion; electronic nose; electronic tongue; feature extraction; feedforward neural net; food industry; fuzzy based models; fuzzy logic based models; gas sensor array; multilayered perceptron; neural networks; pattern classification; potato chips; potato creams; pulsed voltammetry; taste sensor; Electrodes; Electronic noses; Fuzzy neural networks; Instruments; Intelligent networks; Neural networks; Pulse measurements; Semiconductor device measurement; Signal processing algorithms; Tongue;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2000. IMTC 2000. Proceedings of the 17th IEEE
Conference_Location :
Baltimore, MD
ISSN :
1091-5281
Print_ISBN :
0-7803-5890-2
Type :
conf
DOI :
10.1109/IMTC.2000.848719
Filename :
848719
Link To Document :
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