Title :
Design to test migration; a tester and a simulator
Author :
Taylor, Gordon F.
Abstract :
Discusses the advantages of a good migration route from design data to test data. A good route can be established by embedding a design simulator into a test-preparation system, but development of the test-preparation software involves significant engineering work including a close examination of the simulator´s interfaces. The test-preparation simulator can then be made available to designers so that their data can flow smoothly into the test environment
Keywords :
circuit analysis computing; integrated circuit testing; design data; design simulator; design to test migration; migration route; test-preparation system; Application specific integrated circuits; Circuit faults; Circuit simulation; Circuit testing; Design engineering; Integrated circuit modeling; Integrated circuit testing; Packaging; Software testing; System testing;
Conference_Titel :
Design Automation Conference, 1990., EDAC. Proceedings of the European
Conference_Location :
Glasgow
Print_ISBN :
0-8186-2024-2
DOI :
10.1109/EDAC.1990.136713
