DocumentCode
2092566
Title
Design to test migration; a tester and a simulator
Author
Taylor, Gordon F.
fYear
1990
fDate
12-15 Mar 1990
Firstpage
578
Lastpage
582
Abstract
Discusses the advantages of a good migration route from design data to test data. A good route can be established by embedding a design simulator into a test-preparation system, but development of the test-preparation software involves significant engineering work including a close examination of the simulator´s interfaces. The test-preparation simulator can then be made available to designers so that their data can flow smoothly into the test environment
Keywords
circuit analysis computing; integrated circuit testing; design data; design simulator; design to test migration; migration route; test-preparation system; Application specific integrated circuits; Circuit faults; Circuit simulation; Circuit testing; Design engineering; Integrated circuit modeling; Integrated circuit testing; Packaging; Software testing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 1990., EDAC. Proceedings of the European
Conference_Location
Glasgow
Print_ISBN
0-8186-2024-2
Type
conf
DOI
10.1109/EDAC.1990.136713
Filename
136713
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