• DocumentCode
    2092619
  • Title

    Damage Identification Methods for Stiffness Mutation Position of Tower Structure Based on Dynamic Response Information Truncation

  • Author

    Gao, Baifeng ; Li, Huijian ; Li, Yanxia

  • Author_Institution
    Dept. of Eng. Mech., Yanshan Univ., Qinhuangdao, China
  • Volume
    1
  • fYear
    2008
  • fDate
    20-22 Dec. 2008
  • Firstpage
    389
  • Lastpage
    393
  • Abstract
    This paper provides one damage identification method for stiffness mutation position of tower structure based on dynamic response information truncation. On the basis of obtaining dynamic response information of tower structure under environment excitation, wavelet transform is adopted for structure damage location identification. When there is mutation point in integral stiffness of tower structure, stiffness mutation will make stiffness change caused by structure damage difficult to identify. Therefore, through stiffness structure analysis, dynamic response information of structure stiffness mutation position is truncated, and the truncated dynamic response information interval is extended, so as to eliminate the influence of Gibbs phenomenon on the boundary of initial dynamic response information interval, so that structure damage identification of extended information interval will be achieved by wavelet transform. Analysis result of examples shows that this method is very effective and reliable for damage identification of stiffness mutation position of tower structure.
  • Keywords
    dynamic response; inspection; structural engineering; wavelet transforms; Gibbs phenomenon; damage identification methods; environment excitation; stiffness mutation position; stiffness structure analysis; tower structure; truncated dynamic response information interval; wavelet transform; Computer science; Genetic mutations; Information analysis; Load forecasting; Paper technology; Poles and towers; Reliability engineering; Signal processing; Wavelet analysis; Wavelet transforms; damage identification; information extension; information truncation; stiffness mutation; wavelet transform;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Science and Computational Technology, 2008. ISCSCT '08. International Symposium on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-3746-7
  • Type

    conf

  • DOI
    10.1109/ISCSCT.2008.238
  • Filename
    4731451