Validation of circuit extraction procedure by means of frequency and time domain measurement

Author

Antonini, G. ; Scogna, A. Ciccomancini ; Orlandi, A. ; Ricchiuti, V. ; Selli, G. ; Luan, S. ; Drewniak, J.L.

Author_Institution

Dept. of Electr. Eng., L´´Aquila Univ.

Volume

1

fYear

2005

fDate

12-12 Aug. 2005

Firstpage

45

Lastpage

50

Abstract

Aim of this paper is the validation in both frequency and time domain of the procedure to extract fully H-Spice compatible equivalent circuits of structures on printed circuit boards. The procedure is initiated by standard measurement of scattering parameters between 40 MHz to 20 GH. After the extraction of the equivalent circuit, the computed scattering parameters are compared with those measured. The same equivalent circuit is also used for transient analysis in order to compare TDR measurement and eye-pattern to a pseudo-random bit sequence with those coming from the simulations

Keywords

S-parameters; equivalent circuits; network analysis; printed circuits; time-frequency analysis; 40 MHz to 20 GHz; H-Spice compatible equivalent circuits; TDR measurement; circuit extraction; eye-pattern; frequency domain measurement; printed circuit boards; pseudorandom bit sequence; scattering parameters; time domain measurement; transient analysis; Analytical models; Circuit simulation; Computational modeling; Equivalent circuits; Frequency measurement; Measurement standards; Printed circuits; Scattering parameters; Time measurement; Transient analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility, 2005. EMC 2005. 2005 International Symposium on

Conference_Location

Chicago, IL

Print_ISBN

0-7803-9380-5

Type

conf

DOI

10.1109/ISEMC.2005.1513469

Filename

1513469