Title :
Validation of circuit extraction procedure by means of frequency and time domain measurement
Author :
Antonini, G. ; Scogna, A. Ciccomancini ; Orlandi, A. ; Ricchiuti, V. ; Selli, G. ; Luan, S. ; Drewniak, J.L.
Author_Institution :
Dept. of Electr. Eng., L´´Aquila Univ.
Abstract :
Aim of this paper is the validation in both frequency and time domain of the procedure to extract fully H-Spice compatible equivalent circuits of structures on printed circuit boards. The procedure is initiated by standard measurement of scattering parameters between 40 MHz to 20 GH. After the extraction of the equivalent circuit, the computed scattering parameters are compared with those measured. The same equivalent circuit is also used for transient analysis in order to compare TDR measurement and eye-pattern to a pseudo-random bit sequence with those coming from the simulations
Keywords :
S-parameters; equivalent circuits; network analysis; printed circuits; time-frequency analysis; 40 MHz to 20 GHz; H-Spice compatible equivalent circuits; TDR measurement; circuit extraction; eye-pattern; frequency domain measurement; printed circuit boards; pseudorandom bit sequence; scattering parameters; time domain measurement; transient analysis; Analytical models; Circuit simulation; Computational modeling; Equivalent circuits; Frequency measurement; Measurement standards; Printed circuits; Scattering parameters; Time measurement; Transient analysis;
Conference_Titel :
Electromagnetic Compatibility, 2005. EMC 2005. 2005 International Symposium on
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-9380-5
DOI :
10.1109/ISEMC.2005.1513469
