DocumentCode :
2092928
Title :
Analysis on absorbing peak frequency of electromagnetic wave absorption in two low-loss periodically layered dielectric materials
Author :
Ishii, Nozomu ; Miyakawa, Michio ; Ito, Yoshiyuki
Author_Institution :
Fac. of Eng., Niigata Univ.
Volume :
1
fYear :
2005
fDate :
12-12 Aug. 2005
Firstpage :
69
Lastpage :
74
Abstract :
A large absorption of the electromagnetic wave achieves using periodically layered materials with low loss. Our FDTD calculation demonstrates the sharp absorption at discrete frequencies for TM and TE polarizations. These frequencies are called absorbing peak frequencies, which are determined by the characteristic equations related to the transversal resonance in the cross section of the composite material. An equivalent dielectric constant of the composite material is required to solve these equations. One method to estimate the equivalent dielectric constant is based on electrically stored energy in the material, and the other is based on the effective dielectric constant method The absorbing peak frequencies obtained by two methods are compared with FDTD calculation
Keywords :
composite materials; dielectric materials; electromagnetic wave absorption; electromagnetic wave polarisation; finite difference time-domain analysis; permittivity; FDTD; TE polarizations; TM polarizations; absorbing peak frequency; composite material; dielectric constant method; electromagnetic wave absorption; equivalent dielectric constant; two low-loss periodically layered dielectric materials; Composite materials; Dielectric constant; Dielectric materials; Electromagnetic analysis; Electromagnetic scattering; Electromagnetic wave absorption; Equations; Finite difference methods; Frequency estimation; Time domain analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2005. EMC 2005. 2005 International Symposium on
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-9380-5
Type :
conf
DOI :
10.1109/ISEMC.2005.1513474
Filename :
1513474
Link To Document :
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