Title :
Precision frequency measurements with entangled ions
Author :
Roos, Clement ; Chwalla, M. ; Riebe, M. ; Lancaster, G. ; Becher, C. ; Haffner, H. ; Hansel, W. ; Schmidt-Kaler, F. ; Blatt, R.
Author_Institution :
Inst. fur Experimentalphys., Univ. Innsbruck, Innsbruck
Abstract :
Summary form only given. The use of entangled states can provide an increased sensitivity in quantum-limited spectroscopic measurements, leading to an uncertainty that is inversely proportional to the number of particles instead of the usual square-law dependence. In this contribution, we show that spectroscopy with maximally entangled states of atoms also offers significant advantages over experiments done with single atoms. As a first example, we demonstrate that entanglement can be used to effectively eliminate first-order Zeeman shifts in spectroscopy with 40Ca+ even though there are no m=0 -> m=0 transitions. Secondly, we discuss how maximally correlated states of two 40Ca+ could be used for measuring tiny frequency shifts of the S1/2 - D5/2 transition arising from second-order Zeeman shifts and electric quadrupole shifts due to the trapping potential.
Keywords :
Zeeman effect; frequency measurement; measurement uncertainty; quantum entanglement; quantum optics; S1/2 - D5/2 transition; electric quadrupole shifts; entangled ions; entangled states; first-order Zeeman shifts; measurement uncertainty; precision frequency measurement; quantum-limited spectroscopic measurement; second-order Zeeman shifts; square-law dependence; trapping potential;
Conference_Titel :
Frequency and Time Forum, 2004. EFTF 2004. 18th European
Conference_Location :
Guildford
Print_ISBN :
0-86341-384-6