DocumentCode
2093164
Title
A method for the transformation of arbitrary electromagnetic fields based on Huygens principle
Author
Bush, Kirk
Author_Institution
IBM Corp., Endicott, NY, USA
fYear
1990
fDate
32988
Firstpage
217
Lastpage
224
Abstract
The transformation of arbitrary electromagnetic fields is investigated, in order to characterize the near field of the source and transform the result to any location outside the source region. The method presented, referred to as the Huygens principle method, is based on principles of diffraction theory. It is developed from the homogeneous scalar wave equation, and a comparison is made with vector wave equation results based on the Kottler-Franz formulas. The aim is to characterize the sources from measurements made on a surface so as to allow transformation to other locations. The power spectral density is used as the most meaningful characteristic. The method requires measurement of the cross spectral density of the electric or magnetic field. The sensitivity of the Huygens principle method to location error is investigated, and a computer simulation example is presented to illustrate the method. Suggestions for the physical implementation of this transformation method are made
Keywords
electromagnetic fields; spectral analysis; transforms; wave equations; Huygens principle; Kottler-Franz formulas; arbitrary electromagnetic fields; cross spectral density; diffraction theory; electric field; field transformation; homogeneous scalar wave equation; location error sensitivity; magnetic field; near field; power spectral density; source characterisation; source region; spectral analysis; surface measurements; vector wave equation results; Circuit testing; Density measurement; Electromagnetic fields; Electromagnetic interference; Electromagnetic measurements; Kirk field collapse effect; Partial differential equations; Power cables; Power measurement; Printed circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Southern Tier Technical Conference, 1990., Proceedings of the 1990 IEEE
Conference_Location
Binghamton, NY
Type
conf
DOI
10.1109/STIER.1990.324648
Filename
324648
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