• DocumentCode
    2093164
  • Title

    A method for the transformation of arbitrary electromagnetic fields based on Huygens principle

  • Author

    Bush, Kirk

  • Author_Institution
    IBM Corp., Endicott, NY, USA
  • fYear
    1990
  • fDate
    32988
  • Firstpage
    217
  • Lastpage
    224
  • Abstract
    The transformation of arbitrary electromagnetic fields is investigated, in order to characterize the near field of the source and transform the result to any location outside the source region. The method presented, referred to as the Huygens principle method, is based on principles of diffraction theory. It is developed from the homogeneous scalar wave equation, and a comparison is made with vector wave equation results based on the Kottler-Franz formulas. The aim is to characterize the sources from measurements made on a surface so as to allow transformation to other locations. The power spectral density is used as the most meaningful characteristic. The method requires measurement of the cross spectral density of the electric or magnetic field. The sensitivity of the Huygens principle method to location error is investigated, and a computer simulation example is presented to illustrate the method. Suggestions for the physical implementation of this transformation method are made
  • Keywords
    electromagnetic fields; spectral analysis; transforms; wave equations; Huygens principle; Kottler-Franz formulas; arbitrary electromagnetic fields; cross spectral density; diffraction theory; electric field; field transformation; homogeneous scalar wave equation; location error sensitivity; magnetic field; near field; power spectral density; source characterisation; source region; spectral analysis; surface measurements; vector wave equation results; Circuit testing; Density measurement; Electromagnetic fields; Electromagnetic interference; Electromagnetic measurements; Kirk field collapse effect; Partial differential equations; Power cables; Power measurement; Printed circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Southern Tier Technical Conference, 1990., Proceedings of the 1990 IEEE
  • Conference_Location
    Binghamton, NY
  • Type

    conf

  • DOI
    10.1109/STIER.1990.324648
  • Filename
    324648