• DocumentCode
    2093425
  • Title

    An automatic algorithm for equivalent circuit extraction from noisy frequency responses

  • Author

    Grivet-Talocia, S. ; Bandinu, M. ; Canavero, F.G.

  • Author_Institution
    Dipt. di Elettronica, Politecnico di Torino, Turin, Italy
  • Volume
    1
  • fYear
    2005
  • fDate
    8-12 Aug. 2005
  • Firstpage
    163
  • Abstract
    This paper presents a fully automatic algorithm for the extraction of equivalent circuits from noisy frequency responses. The application area involves the generation of SPICE-ready macromodels for critical interconnects for signal integrity characterizations. Direct measurements are often employed to obtain a characterization of a given interconnect structure, leading to its frequency-dependent scattering responses. The proposed technique processes these responses and outputs an equivalent circuit. The algorithm is based on a modification of the well-known vector fitting scheme, which has now become a standard tool in EMC and SI studies. The presented improvements focus on robustness to noise, which is always present in measured data, and on automatic order estimation. These issues are addressed via an automatic detection of any spurious poles due to the noise, which are hard relocated in order to maximize the model accuracy. Several application examples are presented to illustrate the excellent capabilities of the new fitting scheme.
  • Keywords
    SPICE; electromagnetic compatibility; equivalent circuits; frequency response; interconnections; EMC; SPICE-ready macromodels; automatic algorithm; automatic order estimation; equivalent circuit extraction; frequency-dependent scattering responses; noisy frequency responses; signal integrity characterizations; vector fitting scheme; Character generation; Circuit noise; Electromagnetic compatibility; Equivalent circuits; Frequency measurement; Integrated circuit interconnections; Noise measurement; Noise robustness; Scattering; Signal generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2005. EMC 2005. 2005 International Symposium on
  • Print_ISBN
    0-7803-9380-5
  • Type

    conf

  • DOI
    10.1109/ISEMC.2005.1513493
  • Filename
    1513493