DocumentCode :
2093425
Title :
An automatic algorithm for equivalent circuit extraction from noisy frequency responses
Author :
Grivet-Talocia, S. ; Bandinu, M. ; Canavero, F.G.
Author_Institution :
Dipt. di Elettronica, Politecnico di Torino, Turin, Italy
Volume :
1
fYear :
2005
fDate :
8-12 Aug. 2005
Firstpage :
163
Abstract :
This paper presents a fully automatic algorithm for the extraction of equivalent circuits from noisy frequency responses. The application area involves the generation of SPICE-ready macromodels for critical interconnects for signal integrity characterizations. Direct measurements are often employed to obtain a characterization of a given interconnect structure, leading to its frequency-dependent scattering responses. The proposed technique processes these responses and outputs an equivalent circuit. The algorithm is based on a modification of the well-known vector fitting scheme, which has now become a standard tool in EMC and SI studies. The presented improvements focus on robustness to noise, which is always present in measured data, and on automatic order estimation. These issues are addressed via an automatic detection of any spurious poles due to the noise, which are hard relocated in order to maximize the model accuracy. Several application examples are presented to illustrate the excellent capabilities of the new fitting scheme.
Keywords :
SPICE; electromagnetic compatibility; equivalent circuits; frequency response; interconnections; EMC; SPICE-ready macromodels; automatic algorithm; automatic order estimation; equivalent circuit extraction; frequency-dependent scattering responses; noisy frequency responses; signal integrity characterizations; vector fitting scheme; Character generation; Circuit noise; Electromagnetic compatibility; Equivalent circuits; Frequency measurement; Integrated circuit interconnections; Noise measurement; Noise robustness; Scattering; Signal generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2005. EMC 2005. 2005 International Symposium on
Print_ISBN :
0-7803-9380-5
Type :
conf
DOI :
10.1109/ISEMC.2005.1513493
Filename :
1513493
Link To Document :
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