Title :
Multi-fault diagnosis of DC-nonlinear analog circuits
Author :
Luo, Wei-Guo ; Zhang, Su-Wen
Author_Institution :
Dept. of Radio Inf. Eng., Wuhan Univ., China
Abstract :
A method for the fault diagnosis of DC nonlinear analog circuits is proposed. The concepts of independent faulty node compensating current and fault component are introduced, and the sufficient and necessary condition for testability is stated. It is shown that nonlinear networks can be diagnosed effectively if all the nonlinear elements are accessible and there are certain linear accessible nodes.<>
Keywords :
analogue circuits; fault location; nonlinear network analysis; DC-nonlinear analog circuits; fault component; fault diagnosis; independent faulty node compensating current; multifault diagnosis; testability; Analog circuits; Artificial intelligence; Circuit faults; Circuit testing; Current measurement; Equations; Fault diagnosis; Matrix decomposition; Niobium; Voltage control;
Conference_Titel :
Circuits and Systems, 1988., IEEE International Symposium on
Conference_Location :
Espoo, Finland
DOI :
10.1109/ISCAS.1988.15135
