• DocumentCode
    2093793
  • Title

    A precise charge balancing and compliance voltage monitoring stimulator front-end for 1024-electrodes retinal prosthesis

  • Author

    Hosung Chun ; Nhan Tran ; Yuanyuan Yang ; Kavehei, O. ; Shun Bai ; Skafidas, Stan

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Univ. of Melbourne, Melbourne, VIC, Australia
  • fYear
    2012
  • fDate
    Aug. 28 2012-Sept. 1 2012
  • Firstpage
    3001
  • Lastpage
    3004
  • Abstract
    In this paper, we present a precise charge balancing and compliance voltage monitoring stimulator front-end for 1024-electrode retinal prosthesis. Our stimulator is based on current mode stimulation. To generate a precisely matched biphasic current pulse, a dynamic current copying technique is applied at the stimulator front-end. A compliance voltage monitoring circuitry is included at the stimulator front-end to detect if a voltage across electrode-tissue interface goes beyond a predefined compliance voltage. Simulation results show the mismatch of a biphasic current pulse (at a maximum stimulation current of 476μA) is less than 0.1%. Also, the stimulator issues alarm signals, when a voltage compliance occurs during stimulation due to high tissue impedance. Our stimulator is implemented using a 65nm low voltage (LV) CMOS process, which helps reducing implementation area and power consumption.
  • Keywords
    biomedical electrodes; eye; prosthetic power supplies; 1024-electrodes retinal prosthesis; charge balancing; compliance voltage monitoring stimulator front-end; dynamic current copying technique; low voltage CMOS process; power consumption; voltage compliance; voltage monitoring circuitry; CMOS process; Electrodes; Monitoring; Prosthetics; Retina; Safety; Threshold voltage; Electric Stimulation; Electrodes, Implanted; Equipment Design; Humans; Visual Prosthesis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society (EMBC), 2012 Annual International Conference of the IEEE
  • Conference_Location
    San Diego, CA
  • ISSN
    1557-170X
  • Print_ISBN
    978-1-4244-4119-8
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/EMBC.2012.6346595
  • Filename
    6346595