DocumentCode :
2093938
Title :
Characterizing the out-of-band nonlinear behaviour of RF devices: The key to success
Author :
Nader, Charles ; Van Moer, Wendy ; Barbé, Kurt ; Björsell, Niclas ; Händel, Peter
Author_Institution :
Center for RF Meas. Technol., Univ. of Gavle, Gävle, Sweden
fYear :
2011
fDate :
10-12 May 2011
Firstpage :
1
Lastpage :
5
Abstract :
This paper presents a measurement recipe to characterize the out-of-band nonlinear behavior of RF devices when harmonic sampling is used as a digitizing technique. A major challenge to consider when using harmonic sampling is the overlapping of the aliased spectral bins of the digitized waveform. This challenge is more pronounced when using modulated excitation signals. In addition, the excitation signal used should mimic the real behavior of signals used in today´s wireless systems. Hence, this paper provides the reader with a tool to select the proper excitation signal, sampling frequency and record length in order to achieve an accurate characterization of the nonlinear behavior of RF devices.
Keywords :
radiofrequency measurement; signal sampling; RF device; digitized waveform; harmonic sampling; modulated excitation signal; out-of-band nonlinear behaviour; wireless communication system; Bandwidth; Distortion measurement; Frequency measurement; Frequency modulation; Harmonic analysis; Radio frequency; Wireless communication; RF devices; harmonic sampling; large signal network analysis; multisines;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2011 IEEE
Conference_Location :
Binjiang
ISSN :
1091-5281
Print_ISBN :
978-1-4244-7933-7
Type :
conf
DOI :
10.1109/IMTC.2011.5944022
Filename :
5944022
Link To Document :
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