DocumentCode :
2094040
Title :
Applications of FSV to EMC and SI data
Author :
Antonini, G. ; Scogna, A. Ciccomancini ; Orlandi, A. ; Ritona, C. ; Duffy, A.
Author_Institution :
Dept. of Electr. Eng., L´´Aquila Univ., Italy
Volume :
1
fYear :
2005
fDate :
8-12 Aug. 2005
Firstpage :
278
Abstract :
This paper is concerned with the usability of the feature selective validation (FSV) method for comparing validation data. It addresses how it can help in the validation process and how the resulting validation data can be interpreted. It does this by considering two different case studies. The first considers two approaches to modeling electric fields in an equipment rack, and the second compares a Spice model for coupled circuit boards with a reference full wave model. The paper concludes that while the single value summary metrics are helpful to give an overall level of agreement, the detailed point-by-point information is very helpful when considering how to improve the models or measurements involved.
Keywords :
SPICE; coupled circuits; electric fields; electromagnetic compatibility; EMC; Spice model; coupled circuit boards; electric field modeling; feature selective validation method; full wave model; signal integrity; single value summary metrics; Computational electromagnetics; Coupling circuits; Data engineering; Electromagnetic compatibility; Electromagnetic measurements; Finite difference methods; Printed circuits; Q factor; Time domain analysis; Usability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2005. EMC 2005. 2005 International Symposium on
Print_ISBN :
0-7803-9380-5
Type :
conf
DOI :
10.1109/ISEMC.2005.1513514
Filename :
1513514
Link To Document :
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