Title :
Efficient development of power FETs and micromodules
Author :
Bastida, E.M. ; Donzelli, G.P. ; Longari, C. ; Pagani, M. ; Rasà, F. ; Scopelliti, L.
Author_Institution :
Alcatel-Telettra, Via Trento 30, 20059 Vimercate (MI) Italy. Fax +39-39-6080891. Phone +39-39-6864257.
Abstract :
High performance power FETs and micromodules are now produced at Alcatel-Telettra with high yields and low costs. For obtaining these results a very efficient development procedure (here described) is used, which includes a new on wafer test as well as an original and very accurate non linear design method.
Keywords :
Circuit testing; Costs; Etching; FETs; MMICs; Manufacturing; Power measurement; Resists; Temperature; Thermal conductivity;
Conference_Titel :
Microwave Conference, 1993. 23rd European
Conference_Location :
Madrid, Spain
DOI :
10.1109/EUMA.1993.336711
