DocumentCode :
2094437
Title :
Mechanical and electrical characterization of a dendrite connector
Author :
Lin, Shouguan ; Constable, James H. ; Brodsky, William ; Thiel, George H. ; Sun, D.C.
Author_Institution :
State Univ. of New York, Binghamton, NY, USA
fYear :
1997
fDate :
18-21 May 1997
Firstpage :
1105
Lastpage :
1109
Abstract :
A dendrite connector has a taller asperity field than conventional connectors. The surface texture of dendrites on 322 pads has been measured using a WYKO RST PlusTM 3D optical profilometer. The measurements were used to build statistical distributions of the dendrite height and bearing area functions for the force and resistance models. Mechanical and electrical characteristics of a dendrite pad mating with a smooth surface have been studied using two separate experimental techniques. The first set of experiments was done using a computer controlled micro-mechanical tester. A dendrite pad was pushed by a steel rod against a smooth gold plated steel block. The rod was moved in 1 μm steps and the resulting force and resistance at 13 current levels were recorded. In the second set of experiments, a dendrite pad was pushed against a glass microscope slide and the contacting dendrites were observed by placing the entire fixture on a Metallograph microscope. The force was applied using a differential screw and the resulting load was measured using a small load cell attached to the screw. Thus the loading process was directly observed, and images were digitized and processed to determine the contact spots and contact area. Following the mechanical loading, the dendrite samples were again scanned using the WYKO profilometer to determine the permanent deformation of the dendrites. With measured statistical data for the dendrite pads, a Greenwood and Williamson type model was used to predict the contact force and resistance. The results from the model are compared with the experimental results and observations
Keywords :
contact resistance; dendrites; electric connectors; surface texture; surface topography measurement; 3D optical profilometer; Greenwood-Williamson type model; WYKO RST Plus; asperity field; bearing area functions; computer controlled micro-mechanical tester; contact area; contact resistance; contact spots; dendrite connector; differential screw; force models; load cell; resistance models; statistical distributions; surface texture; Area measurement; Connectors; Electrical resistance measurement; Fasteners; Force measurement; Microscopy; Statistical distributions; Steel; Surface resistance; Surface texture;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1997. Proceedings., 47th
Conference_Location :
San Jose, CA
ISSN :
0569-5503
Print_ISBN :
0-7803-3857-X
Type :
conf
DOI :
10.1109/ECTC.1997.606308
Filename :
606308
Link To Document :
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