DocumentCode :
2094583
Title :
On the relationship between polarimetric parameters and soil moisture
Author :
Kim, Yunjin ; Van Zyl, Jakob
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Volume :
1
fYear :
2002
fDate :
2002
Firstpage :
644
Abstract :
Rough surface scattering depends on both roughness and dielectric constant of a surface. Therefore, a polarimetric measurement is useful for estimating soil moisture since we can remove the surface roughness effect using multiple scattering components from a polarimetric measurement. In this paper, we examine the relationship between polarimetric parameters and soil moisture. For example, the co-polarization ratio is independent of surface roughness to the first order of the small perturbation approximation. As surface roughness increases, it can be shown that both co- and cross-polarization ratios depend on the surface slope under the tilted Bragg approximation. The effects of the surface roughness to these ratios are theoretically investigated. An algorithm is proposed to estimate soil moisture from both co- and cross-polarization ratios. We will also study other polarimetric parameters such as the average alpha angle and eigenvalues to understand their relationship with soil moisture.
Keywords :
backscatter; hydrological techniques; moisture measurement; radar cross-sections; radar polarimetry; radar theory; remote sensing by radar; soil; terrain mapping; algorithm; backscatter; co-polarization ratio; dielectric constant; hydrology; measurement technique; polarimetric parameters; polarization; radar polarimetry; radar remote sensing; radar scattering; rough surface; rough surface scattering; roughness; soil moisture; Dielectric constant; Dielectric measurements; Moisture measurement; Radar scattering; Rough surfaces; Sea measurements; Sea surface; Soil measurements; Soil moisture; Surface roughness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Geoscience and Remote Sensing Symposium, 2002. IGARSS '02. 2002 IEEE International
Print_ISBN :
0-7803-7536-X
Type :
conf
DOI :
10.1109/IGARSS.2002.1025132
Filename :
1025132
Link To Document :
بازگشت