DocumentCode :
2094767
Title :
A Geometry-Distortion Resistant Image Detection System Based on Log-Polar Transform and Scale Invariant Feature Transform
Author :
Hsieh, Shang-Lin ; Chen, Yu-Wei ; Chen, Chun-Che ; Chang, Tsun-Wei
Author_Institution :
Dept. of Comput. Sci. & Eng., Tatung Univ., Taipei, Taiwan
fYear :
2011
fDate :
2-4 Sept. 2011
Firstpage :
893
Lastpage :
897
Abstract :
This paper presents an image detection system based on Log-Polar Transform (LPT) and Scale Invariant Feature Transform (SIFT). Unlike other schemes that extract features from the original image, the presented scheme extracts features from the transformed image by LPT. Moreover, the presented scheme utilizes SIFT to extract geometric-invariant features from the LPT images to achieve greater robustness and resistance to geometric distortion. When given a suspect image, the scheme compares the extracted features from the host LPT image and the suspect LPT image to determine similarity. The experimental results show the presented scheme can achieve high recall and precision rates even when the duplicate image is modified and not exactly the same as the host one.
Keywords :
feature extraction; geometry; image processing; transforms; geometric distortion resistance; geometric-invariant feature extraction; image detection system; log-polar transform; scale invariant feature transform; Conferences; Databases; Educational institutions; Feature extraction; Image edge detection; Robustness; Transforms; Geometric-invariant features; Image detection system; Log-Polar Transform; Scale Invariant Feature Transform;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
High Performance Computing and Communications (HPCC), 2011 IEEE 13th International Conference on
Conference_Location :
Banff, AB
Print_ISBN :
978-1-4577-1564-8
Electronic_ISBN :
978-0-7695-4538-7
Type :
conf
DOI :
10.1109/HPCC.2011.128
Filename :
6063094
Link To Document :
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