• DocumentCode
    2094767
  • Title

    A Geometry-Distortion Resistant Image Detection System Based on Log-Polar Transform and Scale Invariant Feature Transform

  • Author

    Hsieh, Shang-Lin ; Chen, Yu-Wei ; Chen, Chun-Che ; Chang, Tsun-Wei

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Tatung Univ., Taipei, Taiwan
  • fYear
    2011
  • fDate
    2-4 Sept. 2011
  • Firstpage
    893
  • Lastpage
    897
  • Abstract
    This paper presents an image detection system based on Log-Polar Transform (LPT) and Scale Invariant Feature Transform (SIFT). Unlike other schemes that extract features from the original image, the presented scheme extracts features from the transformed image by LPT. Moreover, the presented scheme utilizes SIFT to extract geometric-invariant features from the LPT images to achieve greater robustness and resistance to geometric distortion. When given a suspect image, the scheme compares the extracted features from the host LPT image and the suspect LPT image to determine similarity. The experimental results show the presented scheme can achieve high recall and precision rates even when the duplicate image is modified and not exactly the same as the host one.
  • Keywords
    feature extraction; geometry; image processing; transforms; geometric distortion resistance; geometric-invariant feature extraction; image detection system; log-polar transform; scale invariant feature transform; Conferences; Databases; Educational institutions; Feature extraction; Image edge detection; Robustness; Transforms; Geometric-invariant features; Image detection system; Log-Polar Transform; Scale Invariant Feature Transform;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Performance Computing and Communications (HPCC), 2011 IEEE 13th International Conference on
  • Conference_Location
    Banff, AB
  • Print_ISBN
    978-1-4577-1564-8
  • Electronic_ISBN
    978-0-7695-4538-7
  • Type

    conf

  • DOI
    10.1109/HPCC.2011.128
  • Filename
    6063094