DocumentCode
2094862
Title
Multivariate simulation assessment for virtual metrology
Author
Chen, Yeh-Tung ; Yang, Haw-Ching ; Cheng, Fan-tien
Author_Institution
Inst. of Manuf. Eng., Nat. Cheng Kung Univ., Tainan
fYear
2006
fDate
15-19 May 2006
Firstpage
1048
Lastpage
1053
Abstract
To reduce cost, this paper proposes a system architecture to simulate and assess the multivariate of equipment properties. The architecture integrates the Monte Carlo simulation, the neural network model and the sensitivity analysis to construct a virtual metrology system. By assuming the property´s probability distribution, the architecture generates the extreme input data to supplement the actual data for enhancing the model accuracy and estimating the property trend. An industrial case applied to validate the proposed system architecture
Keywords
Monte Carlo methods; measurement systems; neural nets; production engineering computing; quality control; sensitivity analysis; virtual instrumentation; Monte Carlo simulation; multivariate simulation assessment; neural network model; probability distribution; sensitivity analysis; virtual metrology system; Control engineering; Costs; Manufacturing industries; Metrology; Production equipment; Sampling methods; Sensitivity analysis; Sensor phenomena and characterization; Transportation; Virtual manufacturing;
fLanguage
English
Publisher
ieee
Conference_Titel
Robotics and Automation, 2006. ICRA 2006. Proceedings 2006 IEEE International Conference on
Conference_Location
Orlando, FL
ISSN
1050-4729
Print_ISBN
0-7803-9505-0
Type
conf
DOI
10.1109/ROBOT.2006.1641848
Filename
1641848
Link To Document