Title :
Multivariate simulation assessment for virtual metrology
Author :
Chen, Yeh-Tung ; Yang, Haw-Ching ; Cheng, Fan-tien
Author_Institution :
Inst. of Manuf. Eng., Nat. Cheng Kung Univ., Tainan
Abstract :
To reduce cost, this paper proposes a system architecture to simulate and assess the multivariate of equipment properties. The architecture integrates the Monte Carlo simulation, the neural network model and the sensitivity analysis to construct a virtual metrology system. By assuming the property´s probability distribution, the architecture generates the extreme input data to supplement the actual data for enhancing the model accuracy and estimating the property trend. An industrial case applied to validate the proposed system architecture
Keywords :
Monte Carlo methods; measurement systems; neural nets; production engineering computing; quality control; sensitivity analysis; virtual instrumentation; Monte Carlo simulation; multivariate simulation assessment; neural network model; probability distribution; sensitivity analysis; virtual metrology system; Control engineering; Costs; Manufacturing industries; Metrology; Production equipment; Sampling methods; Sensitivity analysis; Sensor phenomena and characterization; Transportation; Virtual manufacturing;
Conference_Titel :
Robotics and Automation, 2006. ICRA 2006. Proceedings 2006 IEEE International Conference on
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-9505-0
DOI :
10.1109/ROBOT.2006.1641848