• DocumentCode
    2094885
  • Title

    Comparison of on-wafer calibrations using the concept of reference impedance

  • Author

    Purroy, Francesc ; Pradell, Lluis

  • Author_Institution
    Universitat Politÿcnica de Catalunya, Department of signal theory and communications, ETSE Telecomunicació. Ap. 30002 - 08080 Barcelona. Spain
  • fYear
    1993
  • fDate
    6-10 Sept. 1993
  • Firstpage
    857
  • Lastpage
    859
  • Abstract
    A novel method that allows to compare different calibration techniques has been developed. It is based on determining the reference impedance of a given Network Analyzer calibration from the reflection coefficient measurement of a physical open circuit. The method has been applied to several on-wafer calibrations.
  • Keywords
    Calibration; Capacitance; Capacitors; Circuits; Computer networks; Error correction; Impedance measurement; Measurement standards; Reflection; Telecommunications;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 1993. 23rd European
  • Conference_Location
    Madrid, Spain
  • Type

    conf

  • DOI
    10.1109/EUMA.1993.336729
  • Filename
    4136790
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2094885