DocumentCode :
2094885
Title :
Comparison of on-wafer calibrations using the concept of reference impedance
Author :
Purroy, Francesc ; Pradell, Lluis
Author_Institution :
Universitat Politÿcnica de Catalunya, Department of signal theory and communications, ETSE Telecomunicació. Ap. 30002 - 08080 Barcelona. Spain
fYear :
1993
fDate :
6-10 Sept. 1993
Firstpage :
857
Lastpage :
859
Abstract :
A novel method that allows to compare different calibration techniques has been developed. It is based on determining the reference impedance of a given Network Analyzer calibration from the reflection coefficient measurement of a physical open circuit. The method has been applied to several on-wafer calibrations.
Keywords :
Calibration; Capacitance; Capacitors; Circuits; Computer networks; Error correction; Impedance measurement; Measurement standards; Reflection; Telecommunications;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 1993. 23rd European
Conference_Location :
Madrid, Spain
Type :
conf
DOI :
10.1109/EUMA.1993.336729
Filename :
4136790
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2094885
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