• DocumentCode
    2094898
  • Title

    Image reconstruction based on 11 regularization for electrical impedance tomography (EIT)

  • Author

    Wang, Qi ; Wang, Huaxiang

  • Author_Institution
    Sch. of Electr. Eng. & Autom., Tianjin Univ., Tianjin, China
  • fYear
    2011
  • fDate
    10-12 May 2011
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Electrical impedance tomography (EIT) aims to estimate the electrical properties at the interior of an object from current-voltage measurements on its boundary. The image reconstruction for EIT is an inverse problem, which is both nonlinear and ill-posed. Little noise in the measured data can cause large errors in the estimated conductivity. Image reconstruction using the l1 regularization allows addressing this difficulty, in comparison to traditional reconstruction using the l2 regularization or Tikhonov method. In this paper, a sum of absolute values are substituted for the sum of squares used in the Tikhonov regularization to form the l1 regularization, the solution is obtained by the barrier method. The selection of parameters is also discussed. Both simulation and experimental results of the l1 regularization method were compared with the l2 regularization method, indicating that the l1 regularization method can improve the quality of image reconstruction and tolerance a relatively high level of noise in the measured voltages.
  • Keywords
    electric current measurement; electric impedance imaging; image denoising; image reconstruction; inverse problems; voltage measurement; EIT; Tikhonov method; Tikhonov regularization; barrier method; conductivity estimation; current-voltage measurement; electrical impedance tomography; electrical property; image reconstruction; inverse problem; l1 regularization method; l2 regularization method; Decision support systems; electrical impedeance tomography (EIT); image reconstruction; l1 regularization; l2 regularization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference (I2MTC), 2011 IEEE
  • Conference_Location
    Binjiang
  • ISSN
    1091-5281
  • Print_ISBN
    978-1-4244-7933-7
  • Type

    conf

  • DOI
    10.1109/IMTC.2011.5944052
  • Filename
    5944052