• DocumentCode
    2094928
  • Title

    A New Modulation Identification Scheme for OFDM in Multipath Rayleigh Fading Channel

  • Author

    Zhang, Jingjing ; Li, Bingbing

  • Author_Institution
    Nat. Key Lab. Of ISN, Xidian Univ., Xian, China
  • Volume
    1
  • fYear
    2008
  • fDate
    20-22 Dec. 2008
  • Firstpage
    793
  • Lastpage
    796
  • Abstract
    This paper applies wavelet transform (WT) on Orthogonal Frequency Division Multiplexing (OFDM) and single carrier (SC) digital signals twice (WT-T) to extract the transient characteristics of them, and then by using the transient characteristics in WT-T domain, it is easy to identify the two types of signals. The simulations show that the proposed identification algorithms can obtain good performances in low signal to noise ratio (SNR) and multipath Rayleigh fading channel. In addition, the effects of sample rate and symbol rate on the identification algorithms are analyzed and simulated. To obtain the best performances of the identification algorithms, sample rate is set to be equal to 2.4 times of carrier frequency approximately, therefor, the difference of characteristics between OFDM and SC signals reaches maximum, while OFDM and SC signals can be well separated if only the symbol rate is greater than 20 kHz.
  • Keywords
    OFDM modulation; Rayleigh channels; multipath channels; wavelet transforms; OFDM; carrier frequency approximation; frequency 20 kHz; modulation identification scheme; multipath Rayleigh fading channel; orthogonal frequency division multiplexing; single carrier digital signal; wavelet transform; AWGN; Algorithm design and analysis; Analytical models; Digital modulation; Fading; Multipath channels; OFDM modulation; Signal processing; Signal to noise ratio; Wavelet transforms; Multipath Rayleigh Fading channel; OFDM; modulation identification; wavelet transform;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Science and Computational Technology, 2008. ISCSCT '08. International Symposium on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-3746-7
  • Type

    conf

  • DOI
    10.1109/ISCSCT.2008.192
  • Filename
    4731543