Title :
Investigation on the susceptibility of microcontrollers to EFT interference
Author :
Musolino, Francesco ; Fiori, Franco
Author_Institution :
Dipt. di Elettronica, Politecnico di Torino, Italy
Abstract :
This paper describes a new measurement method for the evaluation of integrated circuit (IC) susceptibility to conducted interference like electrical fast transients (EFTs). Such a method is based on tide consideration that failures in IC operation are due to RF voltage drops on PCB ground nets and it has been derived with reference to system level (IEC 61000-4-4) and IC level (IEC 62132) standards. The new method has been employed to evaluate the susceptibility of an 8-bit microcontroller.
Keywords :
IEC standards; electromagnetic interference; integrated circuits; microcontrollers; printed circuits; IEC 61000-4-4; IEC 62132; PCB; RF voltage drops; electrical fast transients; integrated circuit susceptibility; interference; microcontrollers susceptibility; Cables; Electromagnetic interference; IEC standards; Microcontrollers; Performance evaluation; Pulse measurements; Radio frequency; Radiofrequency integrated circuits; Receiving antennas; Voltage;
Conference_Titel :
Electromagnetic Compatibility, 2005. EMC 2005. 2005 International Symposium on
Print_ISBN :
0-7803-9380-5
DOI :
10.1109/ISEMC.2005.1513549
