DocumentCode :
2094990
Title :
Causal Markov random field for brain MR image segmentation
Author :
Razlighi, Qolamreza R. ; Orekhov, A. ; Laine, Andrew ; Stern, Y.
Author_Institution :
Neurology Dept., Columbia Univ., New York, NY, USA
fYear :
2012
fDate :
Aug. 28 2012-Sept. 1 2012
Firstpage :
3203
Lastpage :
3206
Abstract :
We propose a new Bayesian classifier, based on the recently introduced causal Markov random field (MRF) model, Quadrilateral MRF (QMRF). We use a second order inhomogeneous anisotropic QMRF to model the prior and likelihood probabilities in the maximum a posteriori (MAP) classifier, named here as MAP-QMRF. The joint distribution of QMRF is given in terms of the product of two dimensional clique distributions existing in its neighboring structure. 20 manually labeled human brain MR images are used to train and assess the MAP-QMRF classifier using the jackknife validation method. Comparing the results of the proposed classifier and FreeSurfer on the Dice overlap measure shows an average gain of 1.8%. We have performed a power analysis to demonstrate that this increase in segmentation accuracy substantially reduces the number of samples required to detect a 5% change in volume of a brain region.
Keywords :
Bayes methods; Markov processes; biomedical MRI; brain; image classification; image segmentation; maximum likelihood estimation; medical image processing; random processes; 2D clique distribution; Bayesian classifier; FreeSurfer; MAP-QMRF classifier; brain MR image segmentation; causal Markov random field; jackknife validation method; maximum a posteriori classifier; quadrilateral MRF; Accuracy; Brain modeling; Equations; Image segmentation; Mathematical model; Random variables; Causal MRF; MRF; MRI; Quadrilateral MRF; brain image segmentation; Algorithms; Brain; Humans; Image Interpretation, Computer-Assisted; Image Processing, Computer-Assisted; Markov Chains;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2012 Annual International Conference of the IEEE
Conference_Location :
San Diego, CA
ISSN :
1557-170X
Print_ISBN :
978-1-4244-4119-8
Electronic_ISBN :
1557-170X
Type :
conf
DOI :
10.1109/EMBC.2012.6346646
Filename :
6346646
Link To Document :
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