Title :
Insights from telecom port conducted emission measurements
Author :
Arnett, D. ; Blankenship, Ed
Author_Institution :
Hewlett-Packard Co., Palo Alto, CA, USA
Abstract :
This paper discusses both the practice of measuring conducted emissions on telecommunication ports, and the insights that can be gained when making such measurements.
Keywords :
electromagnetic interference; telecommunication equipment testing; test equipment; conducted emission measurements; telecommunication ports; Cables; Electromagnetic compatibility; Gain measurement; Impedance; Noise measurement; Printers; Radio frequency; System testing; Telecommunication traffic; Telephony;
Conference_Titel :
Electromagnetic Compatibility, 2005. EMC 2005. 2005 International Symposium on
Print_ISBN :
0-7803-9380-5
DOI :
10.1109/ISEMC.2005.1513551