Title :
The effects of proton irradiation on coolrunner-II - CPID technology
Author :
Garcia-Valderas, M. ; Portela-Garcia, M. ; Lopez-Ongil, C. ; Entrena, L. ; Martin-Ortega, A. ; de Mingo, J.R. ; Alvarez, M. ; Esteve, S. ; Rodriguez, Saul
Author_Institution :
Electron. Technol. Dept., Carlos III Univ. of Madrid, Leganes, Spain
Abstract :
Nowadays, Complex Programmable Devices are highly demanded in space missions. In this sense, CoolRunner-II devices are very attractive due to their low-power consumption. However, there is no report on proton sensitivity for this technology until date. In this work proton irradiation tests were performed on these devices in the energy range from 6 to 63 MeV in both static and dynamic modes. The results reported allow considering these devices suitable for space applications.
Keywords :
logic devices; low-power electronics; proton effects; radiation hardening (electronics); CPLD technology; CoolRunner-II; complex programmable logic devices; low-power consumption; proton irradiation; proton sensitivity; space missions; Field programmable gate arrays; Flash memory; Performance evaluation; Protons; Radiation effects; Random access memory; Sensitivity; CPLD technology; TID; proton irradiation effects; single event effect; single event upset; test facilities;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2008 European Conference on
Conference_Location :
Jyvaskyla
Print_ISBN :
978-1-4577-0481-9
DOI :
10.1109/RADECS.2008.5944064
