• DocumentCode
    2095256
  • Title

    Noise figure measurements on nonlinear devices

  • Author

    Geens, Alain ; Rolain, Yves

  • Author_Institution
    Dept. Electr. TW, Vrije Univ., Brussels, Belgium
  • Volume
    2
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    796
  • Abstract
    A study of the effect of a cubic nonlinearity on the Y-factor method for measuring noise figures is performed. By hypothesis, this technique does not take nonlinearities into account. It is shown that the presence of the nonlinearity largely influences the measured noise figure value. An alternative single tone noise figure measurement setup is proposed to correct the problem
  • Keywords
    electric noise measurement; electron device noise; nonlinear systems; Y-factor method; cubic nonlinearity; noise figure measurement; nonlinear devices; power spectal density; single tone; Bandwidth; Design methodology; Fourier transforms; Linear systems; Noise figure; Noise measurement; Nonlinear systems; Performance evaluation; System testing; Time invariant systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2000. IMTC 2000. Proceedings of the 17th IEEE
  • Conference_Location
    Baltimore, MD
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-5890-2
  • Type

    conf

  • DOI
    10.1109/IMTC.2000.848845
  • Filename
    848845
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2095256