Title :
Instrumentation applications of random-data representation
Author :
Petriu, E.M. ; Zhao, L. ; Das, S.R. ; Cornell, A.
Author_Institution :
Sch. of Inf. Technol. & Eng., Ottawa Univ., Ont., Canada
Abstract :
Extrapolating the von Neuman´s (binary) random-pulse machine concept, the paper discusses the generalized (multi-bit) random-data concept and shows how it can be used for a modular design of robust instrumentation for statistical signal parameter and, especially, of hardware neural networks
Keywords :
circuit CAD; circuit complexity; circuit testing; computerised instrumentation; data structures; neural nets; random number generation; binary random-pulse machine; extrapolation; hardware neural networks; modular design; multi-bit random-data; random-data representation; robust instrumentation; statistical signal parameter; von Neuman´s machine; Application software; Digital arithmetic; Instruments; Neural network hardware; Neural networks; Quantization; Random sequences; Robustness; Signal design; Virtual reality;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2000. IMTC 2000. Proceedings of the 17th IEEE
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-5890-2
DOI :
10.1109/IMTC.2000.848857
