Title :
Application of fourier and wavelet transforms to the identification of EMI noise sources in SMPSs
Author :
Coppola, Luisa ; Buso, Simone ; Liu, Qian ; Boroyevich, Dushan ; Bell, Amy
Author_Institution :
Dept. of Inf. Eng., Padova Univ.
Abstract :
The Fourier and wavelet transform are applied to analyze the signals in a power electronics converter. The wavelet transform makes it possible to have important information about the time evolution of the frequency spectrum. Thank to this post-processing, the source of the harmonic peaks found in the Fourier spectrum can be identified in the time evolution of the signals of the circuit under study
Keywords :
Fourier transforms; circuit noise; electromagnetic interference; switched mode power supplies; switching convertors; wavelet transforms; EMI noise sources identification; Fourier transforms; frequency spectrum; power electronics converter; switch mode power supplies; wavelet transforms; Circuit testing; Continuous wavelet transforms; Discrete Fourier transforms; Electromagnetic interference; Fourier transforms; Frequency; Signal processing; Switches; Wavelet analysis; Wavelet transforms;
Conference_Titel :
Electromagnetic Compatibility, 2005. EMC 2005. 2005 International Symposium on
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-9380-5
DOI :
10.1109/ISEMC.2005.1513582
