• DocumentCode
    2096291
  • Title

    Estimation of arterial baroreflex sensitivity in relation to carotid artery stiffness

  • Author

    Lipponen, J.A. ; Tarvainen, Mika P. ; Laitinen, Tiina ; Karjalainen, Pasi A. ; Vanninen, J. ; Koponen, T. ; Lyyra-Laitinen, T.

  • Author_Institution
    Dept. of Appl. Phys., Univ. of Eastern Finland, Kuopio, Finland
  • fYear
    2012
  • fDate
    Aug. 28 2012-Sept. 1 2012
  • Firstpage
    3408
  • Lastpage
    3411
  • Abstract
    Arterial baroreflex has a significant role in regulating blood pressure. It is known that increased stiffness of the carotid sinus affects mecanotransduction of baroreceptors and therefore limits baroreceptors capability to detect changes in blood pressure. By using high resolution ultrasound video signal and continuous measurement of electrocardiogram (ECG) and blood pressure, it is possible to define elastic properties of artery simultaneously with baroreflex sensitivity parameters. In this paper dataset which consist 38 subjects, 11 diabetics and 27 healthy controls was analyzed. Use of diabetic and healthy test subjects gives wide scale of arteries with different elasticity properties, which provide opportunity to validate baroreflex and artery stiffness estimation methods.
  • Keywords
    biomechanics; biomedical ultrasonics; blood vessels; elasticity; electrocardiography; haemodynamics; ECG; arterial baroreflex sensitivity estimation; baroreceptors; blood pressure; carotid artery stiffness; carotid sinus; continuous measurement; elastic properties; electrocardiogram; high resolution ultrasound video signal; mecanotransduction; Blood pressure; Carotid arteries; Diabetes; Elasticity; Sensitivity; Time series analysis; Adult; Baroreflex; Carotid Arteries; Case-Control Studies; Diabetes Mellitus; Electrocardiography; Humans; Middle Aged; Vascular Stiffness; Young Adult;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society (EMBC), 2012 Annual International Conference of the IEEE
  • Conference_Location
    San Diego, CA
  • ISSN
    1557-170X
  • Print_ISBN
    978-1-4244-4119-8
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/EMBC.2012.6346697
  • Filename
    6346697