Title :
Comparative CAD study for the insertion loss of SAW filters
Author :
Taha, T.E. ; Moustafa, Aly H. ; El-Shennawy, K. ; Zaghloul, M.S.
Author_Institution :
Fac. of Electron. Eng., Minufiya Univ., Egypt
Abstract :
In this paper a comparative Computer Aided Design (CAD) study for three different methods is applied for calculating the insertion loss of Surface Acoustic Wave (SAW) filters. These methods include Simpson Approach Technique, Impulse Response Technique and Elemental Electrostatic Charge Technique. Using sophisticated computer programs based on these methods, the frequency response of SAW filters can be tailored to meet the performance expectation in terms of insertion loss, bandwidth, shape factor and out-of-band suppression level. The obtained results are compared with the published experimental results. The interpretation of these obtained results indicates that, SAW filters, along with the developed programs have the possibility to be used for low loss IF and RF filtering in mobile and wireless communication. Moreover, this can be used for low loss filter stages in cordless phone system and will reduce both noise and power. In addition, Single-Phase-Unidirectional-Transducers Transducers (SPUDT) are capable of operating with insertion loss of less than 3 dB
Keywords :
circuit CAD; frequency response; losses; mobile communication; surface acoustic wave filters; transient response; 3 dB; Elemental Electrostatic Charge Technique; Impulse Response Technique; RF filtering; SAW filters; Simpson Approach Technique; Single-Phase-Unidirectional-Transducers Transducers; bandwidth; computer aided design; cordless phone system; frequency response; insertion loss; low loss IF; mobile communication; out-of-band suppression level; performance; shape factor; surface acoustic wave filters; wireless communication; Acoustic waves; Bandwidth; Design automation; Electrostatics; Frequency response; Insertion loss; Performance loss; SAW filters; Shape; Surface acoustic waves;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2000. IMTC 2000. Proceedings of the 17th IEEE
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-5890-2
DOI :
10.1109/IMTC.2000.848926