DocumentCode :
2096562
Title :
Determination of high frequency package currents from near-field scan data
Author :
Dong, Xiaopeng ; Deng, Shaowei ; Beetner, Daryl G. ; Hubing, Todd H. ; Van Doren, Thomas P.
Volume :
3
fYear :
2005
fDate :
8-12 Aug. 2005
Firstpage :
679
Lastpage :
683
Keywords :
Current distribution; Current measurement; Electromagnetic interference; Electronics packaging; Frequency; Integrated circuit packaging; Magnetic field measurement; Magnetic fields; Probes; Semiconductor device measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2005. EMC 2005. 2005 International Symposium on
Print_ISBN :
0-7803-9380-5
Type :
conf
DOI :
10.1109/ISEMC.2005.1513610
Filename :
1513610
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2096562
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