Title :
Fault diagnostic improvement method for OTM-based testing
Author :
Wong, Mike W T ; Ko, K.Y.
Author_Institution :
Dept. of Electron. & Inf. Eng., Hong Kong Polytech., Kowloon, China
Abstract :
This paper presents an effective combinational testing approach consisting of OTM (Oscillation-based Test Methodology), PSC (Power Supply Current), and NVM (Node Voltage Measurements) to detect and locate catastrophic faults for the threshold detector circuit. The approach comprises three separate phases. In phase-1, OTM is applied to the CUT under test mode. In phase-2, PSC measurements are used to distinguish those faults which would be detected by OTM but causing no oscillation. In phase-3, NVM is applied to further differentiate all those faults within the same equivalent fault set that would be partitioned and could not be distinguished in phase-2
Keywords :
CMOS integrated circuits; circuit oscillations; detector circuits; electric current measurement; fault diagnosis; fault location; integrated circuit testing; mixed analogue-digital integrated circuits; voltage measurement; ASIC testing; OTM-based testing; catastrophic faults; combinational testing approach; fault diagnostic improvement method; node voltage measurements; oscillation-based test methodology; power supply current measurements; threshold detector circuit; Circuit faults; Circuit testing; Current supplies; Detectors; Electrical fault detection; Fault detection; Phase detection; Phase measurement; Power supplies; Voltage measurement;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2000. IMTC 2000. Proceedings of the 17th IEEE
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-5890-2
DOI :
10.1109/IMTC.2000.848933
