Title :
Bias-variance trade-offs analysis using uniform CR bound for images
Author :
Usman, M. ; Hero, A.O. ; Fessler, J.A.
Author_Institution :
Michigan Univ., Ann Arbor, MI, USA
Abstract :
We apply a uniform Cramer-Rao (CR) bound to study the bias-variance trade-offs in parameter estimation. The uniform CR bound is used to specify achievable and unachievable regions in the bias-variance trade-off plane. The applications considered are: (1) two-dimensional single photon emission computed tomography (SPECT) system, and (2) one dimensional edge localization
Keywords :
edge detection; image reconstruction; medical image processing; parameter estimation; single photon emission computed tomography; 2D single photon emission computed tomography; SPECT; achievable region; bias-variance trade-offs; one dimensional edge localization; parameter estimation; unachievable region; uniform CR bound; uniform Cramer-Rao bound; Chromium; Fluctuations; Government; Image analysis; Image processing; Maximum likelihood estimation; Parameter estimation; Random variables; Single photon emission computed tomography; US Department of Energy;
Conference_Titel :
Image Processing, 1994. Proceedings. ICIP-94., IEEE International Conference
Conference_Location :
Austin, TX
Print_ISBN :
0-8186-6952-7
DOI :
10.1109/ICIP.1994.413688
