A new method for power flicker measurement based on interpolated DFT

Author

Haibin, Jin ; Wang, Bin ; Wu, Jing ; Jia, Kai

Author_Institution

Beijing Orient Inst. of Metrol. & Meas. Technol., Beijing, China

fYear

2011

fDate

10-12 May 2011

Firstpage

1

Lastpage

4

Abstract

Measuring power flicker is important in assessing the quality of the electric power. This paper introduces a new method on measuring the modulation ratio of voltage in flicker. We divide the samples of the fluctuating voltage into several groups according to its period. Then the interpolated discrete Fourier transform(DFT) based on Hanning window is used to analyze the rms of each period of samples. All of rms are sorted from small to large. The maximum and minimum rms are used to calculate the modulation ratio of the flicker. The simulation results show that the accuracy of the proposed method is high and it has a rapid computation speed.

Keywords

discrete Fourier transforms; flicker noise; fluctuations; interpolation; power system measurement; DFT; Hanning window; discrete Fourier transform; interpolation; modulation ratio of voltage; power flicker measurement; voltage fluctuation; Discrete Fourier transforms; Fluctuations; Frequency modulation; Power quality; Voltage fluctuations; Voltage measurement; Hanning window; discrete Fourier transform; flicker; modulation ratio of voltag; simulation;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference (I2MTC), 2011 IEEE

Conference_Location

Binjiang

ISSN

1091-5281

Print_ISBN

978-1-4244-7933-7

Type

conf

DOI

10.1109/IMTC.2011.5944125

Filename

5944125