Title :
Pattern approval of measuring instrument in China
Author :
Ye, Yibo ; Lin, Grace ; Li, Zhenlu
Author_Institution :
Div. of Legal Technol., Nat. Inst. of Metrology, Beijing, China
Abstract :
China´s market has lured many manufacturers and companies globally. This paper provides readers with a communication channel to help people understand and follow the regulations, thus speeding up the approval process of measuring instrument imported into China.
Keywords :
instruments; China market; communication channel; measuring instrument; pattern approval; Certification; Fluid flow measurement; Humidity measurement; Instruments; Law; Metrology; Moisture measurement; Pollution measurement; Pressure measurement; Testing;
Conference_Titel :
Electromagnetic Compatibility, 2005. EMC 2005. 2005 International Symposium on
Print_ISBN :
0-7803-9380-5
DOI :
10.1109/ISEMC.2005.1513621
