DocumentCode
2096840
Title
Pattern approval of measuring instrument in China
Author
Ye, Yibo ; Lin, Grace ; Li, Zhenlu
Author_Institution
Div. of Legal Technol., Nat. Inst. of Metrology, Beijing, China
Volume
3
fYear
2005
fDate
8-12 Aug. 2005
Firstpage
736
Abstract
China´s market has lured many manufacturers and companies globally. This paper provides readers with a communication channel to help people understand and follow the regulations, thus speeding up the approval process of measuring instrument imported into China.
Keywords
instruments; China market; communication channel; measuring instrument; pattern approval; Certification; Fluid flow measurement; Humidity measurement; Instruments; Law; Metrology; Moisture measurement; Pollution measurement; Pressure measurement; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 2005. EMC 2005. 2005 International Symposium on
Print_ISBN
0-7803-9380-5
Type
conf
DOI
10.1109/ISEMC.2005.1513621
Filename
1513621
Link To Document